A study of RF oscillator reliability in nanoscale CMOS

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings - 21st European Conference on Circuit Theory and Design
Editors	s.n.
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE
Pages	1-4
Number of pages	4
DOIs	https://doi.org/10.1109/ECCTD.2013.6662205
Publication status	Published - 2013
Event	ECCTD 2013, Dresden, Germany - Piscataway, NJ, USA Duration: 8 Sept 2013 → 12 Sept 2013

Name
Publisher	IEEE

Conference	ECCTD 2013, Dresden, Germany
Period	8/09/13 → 12/09/13

Harvest
Verder nog geen info beschikbaar 12-12-2013

Access to Document

@inproceedings{b565c673d96e4ee9aa145fc5bf96909a,

title = "A study of RF oscillator reliability in nanoscale CMOS",

author = "M Babaie and RB Staszewski",

note = "Harvest Verder nog geen info beschikbaar 12-12-2013; ECCTD 2013, Dresden, Germany ; Conference date: 08-09-2013 Through 12-09-2013",

year = "2013",

doi = "10.1109/ECCTD.2013.6662205",

language = "English",

publisher = "IEEE",

pages = "1--4",

editor = "s.n.",

booktitle = "Proceedings - 21st European Conference on Circuit Theory and Design",

address = "United States",

}

TY - GEN

T1 - A study of RF oscillator reliability in nanoscale CMOS

AU - Babaie, M

AU - Staszewski, RB

N1 - Harvest Verder nog geen info beschikbaar 12-12-2013

PY - 2013

Y1 - 2013

U2 - 10.1109/ECCTD.2013.6662205

DO - 10.1109/ECCTD.2013.6662205

M3 - Conference contribution

SP - 1

EP - 4

BT - Proceedings - 21st European Conference on Circuit Theory and Design

A2 - s.n., null

PB - IEEE

CY - Piscataway, NJ, USA

T2 - ECCTD 2013, Dresden, Germany

Y2 - 8 September 2013 through 12 September 2013

ER -