A study of RF oscillator reliability in nanoscale CMOS

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings - 21st European Conference on Circuit Theory and Design
Editors s.n.
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-4
Number of pages4
DOIs
Publication statusPublished - 2013
EventECCTD 2013, Dresden, Germany - Piscataway, NJ, USA
Duration: 8 Sep 201312 Sep 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceECCTD 2013, Dresden, Germany
Period8/09/1312/09/13

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