A study on combining sets of differently measured dissimilarities

A Ibba, RPW Duin

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

8 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 20th International Conference on Pattern Recognition
EditorsJE Guerrero
Place of PublicationNY, NY, USA
PublisherIEEE Society
Pages3360-3364
Number of pages5
ISBN (Print)978-0-7695-4109-9
DOIs
Publication statusPublished - 2010
Event20th International Conference on Pattern Recognition - NY, NY, USA
Duration: 23 Aug 201026 Aug 2010

Publication series

Name
PublisherIEEE

Conference

Conference20th International Conference on Pattern Recognition
Period23/08/1026/08/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this