A Study on Fault-Tolerant Circuits using Redundancy

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proc. VLSI 2003 Multiconference in Computer Science and Engineering (Las Vegas, NV, USA, June 23-26)
Editors	HR Arabnia, LT Yang
Place of Publication	s.l.
Publisher	s.n.
Pages	65-69
Number of pages	5
Publication status	Published - 2003
Event	VLSI 2003 - s.l. Duration: 23 Jun 2003 → 26 Jun 2003

Name
Publisher	s.n.

Conference	VLSI 2003
Period	23/06/03 → 26/06/03

Keywords

@inproceedings{ea6f92615ef64e1cba3b3c4a03159663,

title = "A Study on Fault-Tolerant Circuits using Redundancy",

keywords = "Conf.proc. > 3 pag",

author = "J Han and PP Jonker",

year = "2003",

language = "Undefined/Unknown",

publisher = "s.n.",

pages = "65--69",

editor = "HR Arabnia and LT Yang",

booktitle = "Proc. VLSI 2003 Multiconference in Computer Science and Engineering (Las Vegas, NV, USA, June 23-26)",

note = "VLSI 2003 ; Conference date: 23-06-2003 Through 26-06-2003",

}

TY - GEN

T1 - A Study on Fault-Tolerant Circuits using Redundancy

AU - Han, J

AU - Jonker, PP

PY - 2003

Y1 - 2003

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 65

EP - 69

BT - Proc. VLSI 2003 Multiconference in Computer Science and Engineering (Las Vegas, NV, USA, June 23-26)

A2 - Arabnia, HR

A2 - Yang, LT

PB - s.n.

CY - s.l.

T2 - VLSI 2003

Y2 - 23 June 2003 through 26 June 2003

ER -