Abstract
In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.
| Original language | English |
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| Title of host publication | 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) |
| Place of Publication | Piscataway, NJ |
| Publisher | IEEE |
| Pages | 1-5 |
| Number of pages | 5 |
| ISBN (Electronic) | 978-1-5090-2106-2 |
| DOIs | |
| Publication status | Published - 18 Apr 2016 |
| Event | EuroSimE 2016: 17th International Conference on Thermal Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - Montpellier, France Duration: 17 Apr 2016 → 20 Apr 2016 Conference number: 17 https://www.eurosime.org/index.php/2016-montpellier/ |
Conference
| Conference | EuroSimE 2016 |
|---|---|
| Country/Territory | France |
| City | Montpellier |
| Period | 17/04/16 → 20/04/16 |
| Internet address |
Keywords
- Reliability
- MOSFET
- Electrolytic Capacitor-Free LED Driver