A test mechanism for device diagnostics and process characterization

LA Rocha, L Mol, E Cretu, RF Wolffenbuttel, J Machado da silva, J.S. matos

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings of the 22nd Conference on Design of Circuits and Integrated Systems
Editors s.n.
Place of Publications.l.
Publishers.n.
Pages597-602
Number of pages6
ISBN (Print)978 84690 8629 2
Publication statusPublished - 2007
EventDCIS 2007: XXII Conference on Design of Circuits and Integrated Systems - Sevilla, Spain
Duration: 21 Nov 200723 Nov 2007
Conference number: 22

Publication series

Name
Publishers.n.

Conference

ConferenceDCIS 2007
CountrySpain
CitySevilla
Period21/11/0723/11/07

Keywords

  • Elektrotechniek
  • Techniek
  • professional journal papers
  • Conf.proc. > 3 pag

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