A thermal diffusivity based frequency reference in standard CMOS with an absolute inaccuracy of +/- 0.1% from -55C to 125C

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	2510-2520
Number of pages	11
Journal	IEEE Journal of Solid State Circuits
Volume	45
Issue number	12
Publication status	Published - 2010

Keywords

@article{b59e1959605a46f392790673fdcd23a3,

title = "A thermal diffusivity based frequency reference in standard CMOS with an absolute inaccuracy of +/- 0.1% from -55C to 125C",

keywords = "CWTS JFIS >= 2.00",

author = "SM Kashmiri and MAP Pertijs and KAA Makinwa",

year = "2010",

language = "English",

volume = "45",

pages = "2510--2520",

journal = "IEEE Journal of Solid State Circuits",

issn = "0018-9200",

publisher = "IEEE",

number = "12",

}

TY - JOUR

T1 - A thermal diffusivity based frequency reference in standard CMOS with an absolute inaccuracy of +/- 0.1% from -55C to 125C

AU - Kashmiri, SM

AU - Pertijs, MAP

AU - Makinwa, KAA

PY - 2010

Y1 - 2010

KW - CWTS JFIS >= 2.00

UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=05599943

M3 - Article

SN - 0018-9200

VL - 45

SP - 2510

EP - 2520

JO - IEEE Journal of Solid State Circuits

JF - IEEE Journal of Solid State Circuits

IS - 12

ER -