A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

J-D Kamminga, R Delhez, Th.H de Keijser, EJ Mittemeijer

    Research output: Contribution to journalArticleScientificpeer-review

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)108-111
    Number of pages4
    JournalJournal of Applied Crystallography
    Publication statusPublished - 2000


    • ZX Int.klas.verslagjaar < 2002

    Cite this