A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

J-D Kamminga, R Delhez, Th.H de Keijser, EJ Mittemeijer

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	108-111
Number of pages	4
Journal	Journal of Applied Crystallography
Volume	33
Publication status	Published - 2000

ISSN 0021-8898

Keywords

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title = "A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "J-D Kamminga and R Delhez and {de Keijser}, Th.H and EJ Mittemeijer",

note = "ISSN 0021-8898",

year = "2000",

language = "Undefined/Unknown",

volume = "33",

pages = "108--111",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

}

TY - JOUR

T1 - A Tool for X-ray Diffraction Analysis of Thin Layers on Substrates: Substrate Peak Removal Method.

AU - Kamminga, J-D

AU - Delhez, R

AU - de Keijser, Th.H

AU - Mittemeijer, EJ

N1 - ISSN 0021-8898

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Article

SN - 0021-8898

VL - 33

SP - 108

EP - 111

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

ER -