A Tractable Failure Probability Prediction Model for Predictive Maintenance Scheduling of Large-Scale Modular-Multilevel-Converters

J. Fu, Saeed Peyghami, Alfredo Nunez, Frede Blaabjerg, B.H.K. De Schutter

Research output: Contribution to journalArticleScientificpeer-review

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Predictive maintenance scheduling of modular-multilevel-converters (MMCs) requires estimations of the failure probabilities of MMCs during a period of time in the future. Particularly, the predicted future failure probabilities are influenced by two main factors, the mission profiles of the MMCs and the maintenance decisions on the MMCs during the prediction period. This paper proposes a failure probability prediction model (FPM) for MMCs by considering these two factors. First, the expectations of the failure probabilities of the components for all the scenarios of mission profiles are obtained. Second, in predictive maintenance scheduling problems, the decisions to perform the maintenance actions are represented by binary variables. When the number of submodules is very large, using the binomial probability form currently used in reliability engineering to express the 'r-out-of-n' failure probability of arms of the MMCs is intractable. Thus, this paper proposes a tractable form (T-form) in FPM by observing that the submodules on one arm are homogeneous. Furthermore, an approximation method, i.e., clustering and assignment (C&A), is proposed to reduce the computation times for calculating the parameters needed by the proposed T-form. Then, we perform a case study that assesses the accuracy and computation time of the C&A approach. The results show that the accuracy of the C&A approach is high and that the computation time is reduced significantly compared with the accurate method. We also show that the computation time for solving the predictive maintenance scheduling problem can be reduced hugely by using the T-form instead of the binomial probability form.

Original languageEnglish
Pages (from-to)6533-6544
JournalIEEE Transactions on Power Electronics
Issue number5
Publication statusPublished - 2023

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