A transient measurement setup for electro-thermal characterisation for SiGe HBTs

PY Sulima, T Zimmer, H Beckrich, JL Battaglia, S Fregonese, D Céli

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationProc. MIXDES (Mixed Design of Integrated Circuits and Systems)
    Editors s.l.
    Place of PublicationCrakow
    Publishers.n.
    Pages22-25
    Number of pages4
    Publication statusPublished - 2005

    Publication series

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    Publishers.n.

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

    Cite this

    Sulima, PY., Zimmer, T., Beckrich, H., Battaglia, JL., Fregonese, S., & Céli, D. (2005). A transient measurement setup for electro-thermal characterisation for SiGe HBTs. In s.l. (Ed.), Proc. MIXDES (Mixed Design of Integrated Circuits and Systems) (pp. 22-25). s.n..