A Uni¿ed Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits

Y Wang, SD Cotofana, Liang Fang

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

49 Citations (Scopus)
Original languageEnglish
Title of host publication2011 IEEE/ACM International Symposium on Nanoscale Architectures
EditorsCA Moritz, I O'Connor
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages175-180
Number of pages6
ISBN (Print)978-1-4577-0995-1
DOIs
Publication statusPublished - 2011
EventNANOARCH 2011 - Piscataway, NJ, USA
Duration: 8 Jun 20119 Jun 2011

Publication series

Name
PublisherIEEE

Conference

ConferenceNANOARCH 2011
Period8/06/119/06/11

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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