Accelerated Degradation Data Analysis Based on Gamma Process With Random Effects

Huiling Zheng, Jun Yang*, Wenda Kang, Yu Zhao

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

Abstract

The Gamma constant-stress accelerated degradation model is a natural model for monotonous degradation processes. However, unit heterogeneity often exists in practice, necessitating a more realistic model. This study develops a Gamma process with random effects to accurately capture accelerated degradation data for reliability analysis, encompassing both point and interval estimation. First, the Expectation-Maximization (EM) algorithm is developed to obtain point estimates of the proposed model. Since these estimates are sensitive to initial values, potentially impacting the outcomes, an improved EM algorithm is proposed, which iteratively refines the estimation quality by executing two different M-steps, thereby enhancing overall estimation accuracy. Secondly, given the complexity of the model and the constraint of small sample sizes and limited stress levels, a three-step interval estimation method is devised. This method segregates the parameters into three distinct parts and addresses them individually using the generalized pivotal quantity method, which simplifies the parameter interval estimation process and enhances the estimation accuracy. Finally, simulation studies and a real example of O-rings are presented to demonstrate the effectiveness of the proposed method.

Original languageEnglish
Pages (from-to)1250-1267
Number of pages18
JournalQuality and Reliability Engineering International
Volume41
Issue number4
DOIs
Publication statusPublished - 2025

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

  • accelerated degradation test
  • EM algorithm
  • Gamma process with random effects
  • generalized confidence interval
  • reliability analysis

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