Original language | English |
---|---|
Pages (from-to) | 1544-1548 |
Number of pages | 5 |
Journal | Microelectronics Reliability |
Volume | 54 |
Issue number | 8 |
DOIs | |
Publication status | Published - 2014 |
Accelerated life time testing and optical degradation of remote phosphor plates
Research output: Contribution to journal › Article › Scientific › peer-review
29
Citations
(Scopus)