Accelerated life time testing and optical degradation of remote phosphor plates

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31 Citations (Scopus)

Original language	English
Pages (from-to)	1544-1548
Number of pages	5
Journal	Microelectronics Reliability
Volume	54
Issue number	8
DOIs	https://doi.org/10.1016/j.microrel.2014.03.014
Publication status	Published - 2014

Harvest
Available online 24-4-2014

Access to Document

@article{309a81158fcb448fa39ed1662bbd750f,

title = "Accelerated life time testing and optical degradation of remote phosphor plates",

author = "{Yazdan Mehr}, M and {van Driel}, WD and GQ Zhang",

note = "Harvest Available online 24-4-2014",

year = "2014",

doi = "10.1016/j.microrel.2014.03.014",

language = "English",

volume = "54",

pages = "1544--1548",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "8",

}

TY - JOUR

T1 - Accelerated life time testing and optical degradation of remote phosphor plates

AU - Yazdan Mehr, M

AU - van Driel, WD

AU - Zhang, GQ

N1 - Harvest Available online 24-4-2014

PY - 2014

Y1 - 2014

U2 - 10.1016/j.microrel.2014.03.014

DO - 10.1016/j.microrel.2014.03.014

M3 - Article

VL - 54

SP - 1544

EP - 1548

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

IS - 8

ER -