Accelerated life time testing and optical degradation of remote phosphor plates

Research output: Contribution to journalArticleScientificpeer-review

31 Citations (Scopus)
Original languageEnglish
Pages (from-to)1544-1548
Number of pages5
JournalMicroelectronics Reliability
Volume54
Issue number8
DOIs
Publication statusPublished - 2014

Bibliographical note

Harvest
Available online 24-4-2014

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