Accuracy Aspects in Multi Phase Flow Metering using X-ray Absorption

VR Bom, MC Clarijs, CWE van Eijk, ZI Kolar, J Frieling, AM Scheers

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

Original languageUndefined/Unknown
Title of host publicationBook of Abstracts of the 2000 IEEE NSS MIC conference, 15-20 October 2000, Lyon, France
Pages71-71
Publication statusPublished - 2000

Keywords

  • ZX Int.klas.verslagjaar < 2002

Cite this