Accuracy Aspects in Multi Phase Flow Metering using X-ray Absorption

VR Bom, MC Clarijs, CWE van Eijk, ZI Kolar, J Frieling, AM Scheers

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientific

    Original languageUndefined/Unknown
    Title of host publicationBook of Abstracts of the 2000 IEEE NSS MIC conference, 15-20 October 2000, Lyon, France
    Publication statusPublished - 2000


    • ZX Int.klas.verslagjaar < 2002

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