Accuracy Improvement of Semi-Analytical Design Sensitivities - An Overview of Recent Developments

A van Keulen, K Vervenne, H de Boer

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 3rd ASMO UK/ISSMO Conference
Editors	Osvaldo.M. Querin
Place of Publication	Leeds, UK
Publisher	University of Leeds
Pages	227-236
Number of pages	10
ISBN (Print)	0-85316-219-0
Publication status	Published - 2001
Event	3rd ASMO UK/ISSMO Conference on Engineering Design Optimisation, Harrogate, North Yorkshore, UK - Leeds, UK Duration: 9 Jul 2001 → …

Name
Publisher	University of Leeds

Conference	3rd ASMO UK/ISSMO Conference on Engineering Design Optimisation, Harrogate, North Yorkshore, UK
Period	9/07/01 → …

Keywords

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title = "Accuracy Improvement of Semi-Analytical Design Sensitivities - An Overview of Recent Developments",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "{van Keulen}, A and K Vervenne and {de Boer}, H",

year = "2001",

language = "Undefined/Unknown",

isbn = "0-85316-219-0",

publisher = "University of Leeds",

pages = "227--236",

editor = "{Osvaldo.M. Querin}",

booktitle = "Proceedings of the 3rd ASMO UK/ISSMO Conference",

note = "3rd ASMO UK/ISSMO Conference on Engineering Design Optimisation, Harrogate, North Yorkshore, UK ; Conference date: 09-07-2001",

}

van Keulen, A, Vervenne, K & de Boer, H 2001, Accuracy Improvement of Semi-Analytical Design Sensitivities - An Overview of Recent Developments. in Osvaldo.M. Querin (ed.), Proceedings of the 3rd ASMO UK/ISSMO Conference. University of Leeds, Leeds, UK, pp. 227-236, 3rd ASMO UK/ISSMO Conference on Engineering Design Optimisation, Harrogate, North Yorkshore, UK, 9/07/01.

Accuracy Improvement of Semi-Analytical Design Sensitivities - An Overview of Recent Developments. / van Keulen, A; Vervenne, K; de Boer, H.
Proceedings of the 3rd ASMO UK/ISSMO Conference. ed. / Osvaldo.M. Querin. Leeds, UK: University of Leeds, 2001. p. 227-236.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Accuracy Improvement of Semi-Analytical Design Sensitivities - An Overview of Recent Developments

AU - van Keulen, A

AU - Vervenne, K

AU - de Boer, H

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-85316-219-0

SP - 227

EP - 236

BT - Proceedings of the 3rd ASMO UK/ISSMO Conference

A2 - Osvaldo.M. Querin, null

PB - University of Leeds

CY - Leeds, UK

T2 - 3rd ASMO UK/ISSMO Conference on Engineering Design Optimisation, Harrogate, North Yorkshore, UK

Y2 - 9 July 2001

ER -