Adaptive pixel defect correction

AA Tanbakuchi; A van der Sijde; B Dillen; AJP Theuwissen; W de Haan

Adaptive pixel defect correction

AA Tanbakuchi, A van der Sijde, B Dillen, AJP Theuwissen, W de Haan

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

26 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of electronic imaging, science and technology; sensors and camera systems for scientific, industrial, and digital photography applications IV
Editors	MM Blouke, N Sampat, RJ Motta
Place of Publication	Bellingham
Publisher	SPIE
Pages	360-370
Number of pages	11
ISBN (Print)	0-8194-4817-6
Publication status	Published - 2003
Event	Sensors and camera systems for scientific, industrial, and digital photography applications, Santa Clara, CA. USA - Bellingham Duration: 21 Jan 2003 → 23 Jan 2003

Publication series

Name
Publisher	The Society for Imaging Science and Technology

Name
Volume	5017

Conference

Conference	Sensors and camera systems for scientific, industrial, and digital photography applications, Santa Clara, CA. USA
Period	21/01/03 → 23/01/03

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{fb3e66b78ed9435ab7fd3830c3c6e3cc,

title = "Adaptive pixel defect correction",

keywords = "Conf.proc. > 3 pag",

author = "AA Tanbakuchi and {van der Sijde}, A and B Dillen and AJP Theuwissen and {de Haan}, W",

year = "2003",

language = "Undefined/Unknown",

isbn = "0-8194-4817-6",

publisher = "SPIE",

pages = "360--370",

editor = "MM Blouke and N Sampat and RJ Motta",

booktitle = "Proceedings of electronic imaging, science and technology; sensors and camera systems for scientific, industrial, and digital photography applications IV",

address = "United States",

note = "Sensors and camera systems for scientific, industrial, and digital photography applications, Santa Clara, CA. USA ; Conference date: 21-01-2003 Through 23-01-2003",

}

Tanbakuchi, AA, van der Sijde, A, Dillen, B, Theuwissen, AJP & de Haan, W 2003, Adaptive pixel defect correction. in MM Blouke, N Sampat & RJ Motta (eds), Proceedings of electronic imaging, science and technology; sensors and camera systems for scientific, industrial, and digital photography applications IV. SPIE, Bellingham, pp. 360-370, Sensors and camera systems for scientific, industrial, and digital photography applications, Santa Clara, CA. USA, 21/01/03.

Adaptive pixel defect correction. / Tanbakuchi, AA; van der Sijde, A; Dillen, B et al.
Proceedings of electronic imaging, science and technology; sensors and camera systems for scientific, industrial, and digital photography applications IV. ed. / MM Blouke; N Sampat; RJ Motta. Bellingham: SPIE, 2003. p. 360-370.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Adaptive pixel defect correction

AU - Tanbakuchi, AA

AU - van der Sijde, A

AU - Dillen, B

AU - Theuwissen, AJP

AU - de Haan, W

PY - 2003

Y1 - 2003

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-8194-4817-6

SP - 360

EP - 370

BT - Proceedings of electronic imaging, science and technology; sensors and camera systems for scientific, industrial, and digital photography applications IV

A2 - Blouke, MM

A2 - Sampat, N

A2 - Motta, RJ

PB - SPIE

CY - Bellingham

T2 - Sensors and camera systems for scientific, industrial, and digital photography applications, Santa Clara, CA. USA

Y2 - 21 January 2003 through 23 January 2003

ER -