Address and data scrambling: causes and impact on memory tests

AJ van de Goor; I Schanstra

Address and data scrambling: causes and impact on memory tests

AJ van de Goor, I Schanstra

Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

55 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	International workshop on Electronic design, test, and applications
Editors	M Renovell, et al.
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	128-137
Number of pages	10
ISBN (Print)	0-7695-1453-7
Publication status	Published - 2002
Event	International Workshop on Electronic design, test and applications - Piscataway, NJ, USA Duration: 29 Jan 2002 → 31 Jan 2002

Publication series

Name
Publisher	IEEE

Conference

Conference	International Workshop on Electronic design, test and applications
Period	29/01/02 → 31/01/02

Keywords

Elektrotechniek
Techniek
conference contrib. refereed
Conf.proc. > 3 pag
ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{c4d938d3d7d54e8eb7eb9fec990ed8cd,

title = "Address and data scrambling: causes and impact on memory tests",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Conf.proc. > 3 pag, ZX Int.klas.verslagjaar < 2002",

author = "{van de Goor}, AJ and I Schanstra",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7695-1453-7",

publisher = "IEEE Society",

pages = "128--137",

editor = "M Renovell and {et al.}",

booktitle = "International workshop on Electronic design, test, and applications",

note = "International Workshop on Electronic design, test and applications ; Conference date: 29-01-2002 Through 31-01-2002",

}

Address and data scrambling: causes and impact on memory tests. / van de Goor, AJ; Schanstra, I.
International workshop on Electronic design, test, and applications. ed. / M Renovell; et al. Piscataway, NJ, USA: IEEE Society, 2002. p. 128-137.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Address and data scrambling: causes and impact on memory tests

AU - van de Goor, AJ

AU - Schanstra, I

PY - 2002

Y1 - 2002

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7695-1453-7

SP - 128

EP - 137

BT - International workshop on Electronic design, test, and applications

A2 - Renovell, M

A2 - et al., null

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - International Workshop on Electronic design, test and applications

Y2 - 29 January 2002 through 31 January 2002

ER -