Address and data scrambling: causes and impact on memory tests

AJ van de Goor, I Schanstra

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

51 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationInternational workshop on Electronic design, test, and applications
EditorsM Renovell, et al.
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages128-137
Number of pages10
ISBN (Print)0-7695-1453-7
Publication statusPublished - 2002
EventInternational Workshop on Electronic design, test and applications - Piscataway, NJ, USA
Duration: 29 Jan 200231 Jan 2002

Publication series

Name
PublisherIEEE

Conference

ConferenceInternational Workshop on Electronic design, test and applications
Period29/01/0231/01/02

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag
  • ZX Int.klas.verslagjaar < 2002

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