Advanced method for electrical characterization of carrier-selective passivating contacts using transfer-length-method measurements under variable illumination

L.L. Senaud, P. Procel , G. Christmann, A. Descoeudres, J. Geissbühler, C. Allebé, N. Badel, P. Wyss, M. Boccard, O. Isabella, M. Zeman, S. Nicolay, M. Despeisse, C. Ballif, B. Paviet-Salomon

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Physics & Astronomy