Advanced scanning probes for micro-nano science researchers

T Akiyama, S. Gautsch, D Parrat, R Imer, P Vettiger, U Staufer, NF de Rooij

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Journal	IEEJ Transactions on Electrical and Electronic Engineering
Volume	5
Publication status	Published - 2010

Keywords

@article{77f16e2d07e648bca6be592da86818b3,

title = "Advanced scanning probes for micro-nano science researchers",

keywords = "professional journal papers, CWTS JFIS < 0.75",

author = "T Akiyama and S. Gautsch and D Parrat and R Imer and P Vettiger and U Staufer and {de Rooij}, NF",

year = "2010",

language = "English",

volume = "5",

journal = "IEEJ Transactions on Electrical and Electronic Engineering",

issn = "1931-4973",

publisher = "John Wiley & Sons",

}

TY - JOUR

T1 - Advanced scanning probes for micro-nano science researchers

AU - Akiyama, T

AU - Gautsch, S.

AU - Parrat, D

AU - Imer, R

AU - Vettiger, P

AU - Staufer, U

AU - de Rooij, NF

PY - 2010

Y1 - 2010

KW - professional journal papers

KW - CWTS JFIS < 0.75

M3 - Article

SN - 1931-4973

VL - 5

JO - IEEJ Transactions on Electrical and Electronic Engineering

JF - IEEJ Transactions on Electrical and Electronic Engineering

ER -