Advanced Terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

AJL Adam, JM Brok, M.A. Seo, K.J. Ahn, D.S. Kim, JH Kang, M. Nagel, PCM Planken

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{c662c554225f496393344a426da5e78e,

title = "Advanced Terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum",

keywords = "professional journal papers, CWTS JFIS >= 2.00",

author = "AJL Adam and JM Brok and M.A. Seo and K.J. Ahn and D.S. Kim and JH Kang and M. Nagel and PCM Planken",

year = "2008",

language = "Undefined/Unknown",

volume = "16",

pages = "8054--8054",

journal = "Optics Express",

issn = "1094-4087",

publisher = "The Optical Society",

number = "11",

}

TY - JOUR

T1 - Advanced Terahertz electric near-field measurements at sub-wavelength diameter metallic apertures: erratum

AU - Adam, AJL

AU - Brok, JM

AU - Seo, M.A.

AU - Ahn, K.J.

AU - Kim, D.S.

AU - Kang, JH

AU - Nagel, M.

AU - Planken, PCM

PY - 2008

Y1 - 2008

KW - professional journal papers

KW - CWTS JFIS >= 2.00

M3 - Article

SN - 1094-4087

VL - 16

SP - 8054

EP - 8054

JO - Optics Express

JF - Optics Express

IS - 11

ER -