Advanced Terahertz electric near-flied measurements at sub-wavelenght diameter metallic apertures.

AJL Adam, JM Brok, M.A. Seo, K.J. Ahn, D.S. Kim, JH Kang, Q-H. Park, M. Nagel, PCM Planken

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{43d70c085cf1451db1f58da261e8b1b4,

title = "Advanced Terahertz electric near-flied measurements at sub-wavelenght diameter metallic apertures.",

keywords = "professional journal papers, CWTS JFIS >= 2.00",

author = "AJL Adam and JM Brok and M.A. Seo and K.J. Ahn and D.S. Kim and JH Kang and Q-H. Park and M. Nagel and PCM Planken",

year = "2008",

language = "Undefined/Unknown",

volume = "16",

pages = "7407--7417",

journal = "Optics Express",

issn = "1094-4087",

publisher = "The Optical Society",

number = "10",

}

TY - JOUR

T1 - Advanced Terahertz electric near-flied measurements at sub-wavelenght diameter metallic apertures.

AU - Adam, AJL

AU - Brok, JM

AU - Seo, M.A.

AU - Ahn, K.J.

AU - Kim, D.S.

AU - Kang, JH

AU - Park, Q-H.

AU - Nagel, M.

AU - Planken, PCM

PY - 2008

Y1 - 2008

KW - professional journal papers

KW - CWTS JFIS >= 2.00

M3 - Article

SN - 1094-4087

VL - 16

SP - 7407

EP - 7417

JO - Optics Express

JF - Optics Express

IS - 10

ER -