Alignment control of STEM a ronchigram based approach

SW van der Hoeven, AJ den Dekker, A Tejada Ruiz

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	English
Pages (from-to)	118-119
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	S2
Publication status	Published - 2009

Keywords

@article{7e080eac01504a78bd8dd0a83bd8c171,

title = "Alignment control of STEM a ronchigram based approach",

keywords = "CWTS JFIS < 0.75",

author = "{van der Hoeven}, SW and {den Dekker}, AJ and {Tejada Ruiz}, A",

year = "2009",

language = "English",

volume = "15",

pages = "118--119",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S2",

}