An accelerated test method of luminous flux depreciation for LED luminaires and lamps

Cheng Qian, Xuejun Fan, JJ Fan, C.A. Yuan, Guo Qi Zhang

Research output: Contribution to journalArticleScientificpeer-review

46 Citations (Scopus)


Light Emitting Diode (LED) luminaires and lamps are energy-saving and environmental friendly alternatives to traditional lighting products. However, current luminous flux depreciation test at luminaire and lamp level requires a minimum of 6000 h testing, which is even longer than the product development cycle time. This paper develops an accelerated test method for luminous flux depreciation to reduce the test time within 2000 h at an elevated temperature. The method is based on lumen maintenance boundary curve, obtained from a collection of LED source lumen depreciation data, known as LM-80 data. The exponential decay model and Arrhenius acceleration relationship are used to determine the new threshold of lumen maintenance and acceleration factor. The proposed method has been verified by a number of simulation studies and experimental data for a wide range of LED luminaire and lamp types from both internal and external experiments. The qualification results obtained by the accelerated test method agree well with traditional 6000 h tests.
Original languageEnglish
Pages (from-to)84-92
Number of pages9
JournalReliability Engineering & System Safety
Issue numberMarch
Publication statusPublished - 2016


  • LED luminaire and lamp
  • Luminous flux depreciation
  • Lumen maintenance
  • Accelerated test
  • LM-80
  • Boundary curve


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