An adaptive Cu trace fatigue model based on average cross-section strain

DM Farley, Y Zhou, A Dasgupta, JWC de Vries

Research output: Contribution to journalArticleScientific

Original languageEnglish
Pages (from-to)2763-2772
Number of pages10
JournalMicroelectronics Reliability
Volume52
Issue number11
DOIs
Publication statusPublished - 2013

Keywords

  • academic journal papers
  • CWTS JFIS < 0.75

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