Original language | English |
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Pages (from-to) | 783-793 |
Number of pages | 11 |
Journal | Microelectronics Reliability |
Volume | 52 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2012 |
An approach to "design for reliability" in solid state lighting systems at high temperatures
S Tarashioon, A Baiano, H van Zeijl, C Guo, SW Koh, WD van Driel, GQ Zhang
Research output: Contribution to journal › Article › Scientific › peer-review
35
Citations
(Scopus)