An Assessment Methodology for Trace Reduction Techniques

SGM Cornelissen; LMF Moonen; A. Zaidman

An Assessment Methodology for Trace Reduction Techniques

SGM Cornelissen, LMF Moonen, A. Zaidman

Software Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

21 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of the 24th International Conference on Software Maintenance
Editors	Kenny Wong Mei, K Wong
Place of Publication	Los Alamitos, USA
Publisher	IEEE
Pages	107-116
Number of pages	10
ISBN (Print)	978-1-4244-2614-0
Publication status	Published - 2008
Event	24th International Conference on Software Maintenance (ICSM 2008) - Los Alamitos, USA Duration: 28 Sept 2008 → 4 Oct 2008

Publication series

Name
Publisher	IEEE Computer Society

Conference

Conference	24th International Conference on Software Maintenance (ICSM 2008)
Period	28/09/08 → 4/10/08

Bibliographical note

Cornelissen:2008.icsm

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{0e0d000436c54492bb2af3f320e51126,

title = "An Assessment Methodology for Trace Reduction Techniques",

keywords = "Conf.proc. > 3 pag",

author = "SGM Cornelissen and LMF Moonen and A. Zaidman",

note = "Cornelissen:2008.icsm; 24th International Conference on Software Maintenance (ICSM 2008) ; Conference date: 28-09-2008 Through 04-10-2008",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-1-4244-2614-0",

publisher = "IEEE",

pages = "107--116",

editor = "Mei, {Kenny Wong} and K Wong",

booktitle = "Proceedings of the 24th International Conference on Software Maintenance",

address = "United States",

}

An Assessment Methodology for Trace Reduction Techniques. / Cornelissen, SGM; Moonen, LMF; Zaidman, A.
Proceedings of the 24th International Conference on Software Maintenance. ed. / Kenny Wong Mei; K Wong. Los Alamitos, USA: IEEE, 2008. p. 107-116.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - An Assessment Methodology for Trace Reduction Techniques

AU - Cornelissen, SGM

AU - Moonen, LMF

AU - Zaidman, A.

N1 - Cornelissen:2008.icsm

PY - 2008

Y1 - 2008

KW - Conf.proc. > 3 pag

UR - http://swerl.tudelft.nl/twiki/pub/Main/TechnicalReports/TUD-SERG-2008-016.pdf

M3 - Conference contribution

SN - 978-1-4244-2614-0

SP - 107

EP - 116

BT - Proceedings of the 24th International Conference on Software Maintenance

A2 - Mei, Kenny Wong

A2 - Wong, K

PB - IEEE

CY - Los Alamitos, USA

T2 - 24th International Conference on Software Maintenance (ICSM 2008)

Y2 - 28 September 2008 through 4 October 2008

ER -

An Assessment Methodology for Trace Reduction Techniques

Publication series

Conference

Bibliographical note

Keywords

Other files and links

Cite this