An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

N Saputra, MM Danesh, A Baiano, R Ishihara, JR Long, N Karaki, S Inoue

Research output: Contribution to journalArticleScientificpeer-review

17 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)1563-1576
Number of pages14
JournalIEEE Journal of Solid State Circuits
Issue number7
Publication statusPublished - 2008


  • academic journal papers
  • CWTS JFIS >= 2.00

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