An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

N Saputra, MM Danesh, A Baiano, R Ishihara, JR Long, N Karaki, S Inoue

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	1563-1576
Number of pages	14
Journal	IEEE Journal of Solid State Circuits
Volume	43
Issue number	7
Publication status	Published - 2008

Keywords

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title = "An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration",

keywords = "academic journal papers, CWTS JFIS >= 2.00",

author = "N Saputra and MM Danesh and A Baiano and R Ishihara and JR Long and N Karaki and S Inoue",

year = "2008",

language = "Undefined/Unknown",

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pages = "1563--1576",

journal = "IEEE Journal of Solid State Circuits",

issn = "0018-9200",

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TY - JOUR

T1 - An assessment of ¿-czochralski, single-grain silicon thin-film transistor technology for large-area, sensor and 3-D electronic integration

AU - Saputra, N

AU - Danesh, MM

AU - Baiano, A

AU - Ishihara, R

AU - Long, JR

AU - Karaki, N

AU - Inoue, S

PY - 2008

Y1 - 2008

KW - academic journal papers

KW - CWTS JFIS >= 2.00

M3 - Article

SN - 0018-9200

VL - 43

SP - 1563

EP - 1576

JO - IEEE Journal of Solid State Circuits

JF - IEEE Journal of Solid State Circuits

IS - 7

ER -