Abstract
The readout of high-impedance sensors and sampled voltage references [1] requires amplifiers that can achieve both low offset and low input current. Recently, it has been shown that this unique combination can be achieved by an auto-zero (AZ) stabilized buffer [2]. However, its low-frequency noise density is surd 5 times higher than the buffer's own white-noise voltage spectral density e n . Furthermore, its input current is not constant, but varies significantly with the input voltage. To overcome the first issue, a chopped AZ stabilization loop with an optimized duty-cycle is proposed to bring the low-frequency noise density close to surd 2cdot {e}-{n}, the fundamental limit of an AZ stabilized amplifier. The second issue is solved by replacing the transmission-gate input switches used in [2] with NMOS switches and a constant Vgs drive. This keeps their charge injection constant over a wide input voltage range, and results in a constant input current.
Original language | English |
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Title of host publication | 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 |
Editors | Jan van der Spiegel |
Place of Publication | Piscataway, NJ |
Publisher | IEEE |
Pages | 298-300 |
Number of pages | 3 |
Volume | 2019-February |
ISBN (Electronic) | 978-1-5386-8531-0 |
ISBN (Print) | 978-1-5386-8532-7 |
DOIs | |
Publication status | Published - 2019 |
Event | ISSCC 2019: IEEE International Solid-State Circuits Conference - San Francisco, CA, United States Duration: 17 Feb 2019 → 21 Feb 2019 |
Conference
Conference | ISSCC 2019 |
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Country/Territory | United States |
City | San Francisco, CA |
Period | 17/02/19 → 21/02/19 |
Bibliographical note
Session 18.3Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- Low-frequency noise
- Current measurement
- Voltage measurement
- MOS devices
- Capacitors
- Chopper (circuits)
- Switches