An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Abstract

The current demands for developing safe automotive applications require extensive analysis and evaluation of potential random hardware faults. In general, part of this analysis is manually performed by experts, resulting in an expensive, time-consuming, and error-prone process. This paper proposes an automated approach to classify faults overlooked by traditional methods. Our methodology deploys code coverage and formal to identify nodes that do not disrupt safety-critical functionalities, enabling the classification of additional faults. The approach is validated based on an Automotive CPU, according to ISO 26262 guidelines. The results show an improvement in Diagnostic Coverage of 1.15%, increasing the Single Point Fault Metric (SPFM) to 97.3%, enabling ASIL C compliance without any hardware redundancy.
Original languageEnglish
Title of host publication2021 IEEE International Test Conference (ITC)
Subtitle of host publicationProceedings
EditorsRandall S. Bilof
Place of PublicationPiscataway
PublisherIEEE
Pages329-333
Number of pages5
ISBN (Electronic)978-1-6654-1695-5
ISBN (Print)978-1-6654-1696-2
DOIs
Publication statusPublished - 2021
Event2021 IEEE International Test Conference - Virtual at Anaheim, United States
Duration: 10 Oct 202115 Oct 2021

Conference

Conference2021 IEEE International Test Conference
CountryUnited States
CityVirtual at Anaheim
Period10/10/2115/10/21

Keywords

  • ISO 26262
  • Safe Faults
  • Fault Injection
  • Formal Methods
  • Simulation
  • Functional Safety
  • Verification

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