An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs

Felipe Augusto da Silva; Ahmet Cagri Bagbaba; Said Hamdioui; Christian Sauer

doi:10.1109/ITC50571.2021.00047

An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Abstract

The current demands for developing safe automotive applications require extensive analysis and evaluation of potential random hardware faults. In general, part of this analysis is manually performed by experts, resulting in an expensive, time-consuming, and error-prone process. This paper proposes an automated approach to classify faults overlooked by traditional methods. Our methodology deploys code coverage and formal to identify nodes that do not disrupt safety-critical functionalities, enabling the classification of additional faults. The approach is validated based on an Automotive CPU, according to ISO 26262 guidelines. The results show an improvement in Diagnostic Coverage of 1.15%, increasing the Single Point Fault Metric (SPFM) to 97.3%, enabling ASIL C compliance without any hardware redundancy.

Original language	English
Title of host publication	Proceedings - 2021 IEEE International Test Conference, ITC 2021
Subtitle of host publication	Proceedings
Editors	Randall S. Bilof
Place of Publication	Piscataway
Publisher	IEEE
Pages	329-333
Number of pages	5
ISBN (Electronic)	978-1-6654-1695-5
ISBN (Print)	978-1-6654-1696-2
DOIs	https://doi.org/10.1109/ITC50571.2021.00047
Publication status	Published - 2021
Event	2021 IEEE International Test Conference - Virtual at Anaheim, United States Duration: 10 Oct 2021 → 15 Oct 2021

Publication series

Name	Proceedings - International Test Conference
ISSN (Print)	1089-3539

Conference

Conference	2021 IEEE International Test Conference
Country/Territory	United States
City	Virtual at Anaheim
Period	10/10/21 → 15/10/21

Keywords

ISO 26262
Safe Faults
Fault Injection
Formal Methods
Simulation
Functional Safety
Verification

Access to Document

10.1109/ITC50571.2021.00047

Cite this

Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S., & Sauer, C. (2021). An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. In R. S. Bilof (Ed.), Proceedings - 2021 IEEE International Test Conference, ITC 2021: Proceedings (pp. 329-333). [9611308] (Proceedings - International Test Conference). IEEE . https://doi.org/10.1109/ITC50571.2021.00047

Augusto da Silva, Felipe ; Bagbaba, Ahmet Cagri ; Hamdioui, Said ; Sauer, Christian. / An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. Proceedings - 2021 IEEE International Test Conference, ITC 2021: Proceedings. editor / Randall S. Bilof. Piscataway : IEEE , 2021. pp. 329-333 (Proceedings - International Test Conference).

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title = "An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs",

abstract = "The current demands for developing safe automotive applications require extensive analysis and evaluation of potential random hardware faults. In general, part of this analysis is manually performed by experts, resulting in an expensive, time-consuming, and error-prone process. This paper proposes an automated approach to classify faults overlooked by traditional methods. Our methodology deploys code coverage and formal to identify nodes that do not disrupt safety-critical functionalities, enabling the classification of additional faults. The approach is validated based on an Automotive CPU, according to ISO 26262 guidelines. The results show an improvement in Diagnostic Coverage of 1.15%, increasing the Single Point Fault Metric (SPFM) to 97.3%, enabling ASIL C compliance without any hardware redundancy.",

keywords = "ISO 26262, Safe Faults, Fault Injection, Formal Methods, Simulation, Functional Safety, Verification",

author = "{Augusto da Silva}, Felipe and Bagbaba, {Ahmet Cagri} and Said Hamdioui and Christian Sauer",

year = "2021",

doi = "10.1109/ITC50571.2021.00047",

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pages = "329--333",

editor = "Bilof, {Randall S.}",

booktitle = "Proceedings - 2021 IEEE International Test Conference, ITC 2021",

address = "United States",

note = "2021 IEEE International Test Conference ; Conference date: 10-10-2021 Through 15-10-2021",

}

Augusto da Silva, F, Bagbaba, AC, Hamdioui, S & Sauer, C 2021, An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. in RS Bilof (ed.), Proceedings - 2021 IEEE International Test Conference, ITC 2021: Proceedings., 9611308, Proceedings - International Test Conference, IEEE , Piscataway, pp. 329-333, 2021 IEEE International Test Conference, Virtual at Anaheim, United States, 10/10/21. https://doi.org/10.1109/ITC50571.2021.00047

An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. / Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian.

Proceedings - 2021 IEEE International Test Conference, ITC 2021: Proceedings. ed. / Randall S. Bilof. Piscataway : IEEE , 2021. p. 329-333 9611308 (Proceedings - International Test Conference).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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N2 - The current demands for developing safe automotive applications require extensive analysis and evaluation of potential random hardware faults. In general, part of this analysis is manually performed by experts, resulting in an expensive, time-consuming, and error-prone process. This paper proposes an automated approach to classify faults overlooked by traditional methods. Our methodology deploys code coverage and formal to identify nodes that do not disrupt safety-critical functionalities, enabling the classification of additional faults. The approach is validated based on an Automotive CPU, according to ISO 26262 guidelines. The results show an improvement in Diagnostic Coverage of 1.15%, increasing the Single Point Fault Metric (SPFM) to 97.3%, enabling ASIL C compliance without any hardware redundancy.

AB - The current demands for developing safe automotive applications require extensive analysis and evaluation of potential random hardware faults. In general, part of this analysis is manually performed by experts, resulting in an expensive, time-consuming, and error-prone process. This paper proposes an automated approach to classify faults overlooked by traditional methods. Our methodology deploys code coverage and formal to identify nodes that do not disrupt safety-critical functionalities, enabling the classification of additional faults. The approach is validated based on an Automotive CPU, according to ISO 26262 guidelines. The results show an improvement in Diagnostic Coverage of 1.15%, increasing the Single Point Fault Metric (SPFM) to 97.3%, enabling ASIL C compliance without any hardware redundancy.

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Augusto da Silva F, Bagbaba AC, Hamdioui S, Sauer C. An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. In Bilof RS, editor, Proceedings - 2021 IEEE International Test Conference, ITC 2021: Proceedings. Piscataway: IEEE . 2021. p. 329-333. 9611308. (Proceedings - International Test Conference). https://doi.org/10.1109/ITC50571.2021.00047

An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs

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