An effort to study inplane electrical transport in nanometer-sized structures on silicon.

S Rogge, C Bisch, AW Dunn, B Ilge, T Melin, C Dekker, GMT Janssen, LJ Geerligs

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationProceedings 10th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy.
EditorsY Kuk, IW Lyo, D Jeon, S-I Park
Pages402-403
Number of pages2
Publication statusPublished - 1999

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