An effort to study inplane electrical transport in nanometer-sized structures on silicon.

S Rogge, C Bisch, AW Dunn, B Ilge, T Melin, C Dekker, GMT Janssen, LJ Geerligs

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	Proceedings 10th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy.
Editors	Y Kuk, IW Lyo, D Jeon, S-I Park
Pages	402-403
Number of pages	2
Publication status	Published - 1999

Cite this

Rogge, S., Bisch, C., Dunn, AW., Ilge, B., Melin, T., Dekker, C., Janssen, GMT., & Geerligs, LJ. (1999). An effort to study inplane electrical transport in nanometer-sized structures on silicon. In Y. Kuk, IW. Lyo, D. Jeon, & S.-I. Park (Eds.), Proceedings 10th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy. (pp. 402-403)

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title = "An effort to study inplane electrical transport in nanometer-sized structures on silicon.",

author = "S Rogge and C Bisch and AW Dunn and B Ilge and T Melin and C Dekker and GMT Janssen and LJ Geerligs",

year = "1999",

language = "Undefined/Unknown",

pages = "402--403",

editor = "Y Kuk and IW Lyo and D Jeon and S-I Park",

booktitle = "Proceedings 10th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy.",

}

An effort to study inplane electrical transport in nanometer-sized structures on silicon. / Rogge, S; Bisch, C; Dunn, AW et al.
Proceedings 10th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy.. ed. / Y Kuk; IW Lyo; D Jeon; S-I Park. 1999. p. 402-403.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - An effort to study inplane electrical transport in nanometer-sized structures on silicon.

AU - Rogge, S

AU - Bisch, C

AU - Dunn, AW

AU - Ilge, B

AU - Melin, T

AU - Dekker, C

AU - Janssen, GMT

AU - Geerligs, LJ

PY - 1999

Y1 - 1999

M3 - Conference contribution

SP - 402

EP - 403

BT - Proceedings 10th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy.

A2 - Kuk, Y

A2 - Lyo, IW

A2 - Jeon, D

A2 - Park, S-I

ER -