An Empirical Study on the Usage of Testability Information to Fault Localization in Software

A Gonzalez Sanchez, RF Lima Maranhao De Abreu, HG Gross, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

7 Citations (Scopus)
Original languageEnglish
Title of host publication2011 ACM International Symposium on Applied Computing (SAC'11)
EditorsW Chu, WE Wang, MJ Palakal, C-C Hung
Place of PublicationNew York, NY, USA
PublisherAssociation for Computing Machinery (ACM)
Pages1398-1403
Number of pages6
ISBN (Print)978-1-4503-0113-8
DOIs
Publication statusPublished - 2011
EventSAC'11 - New York, NY, USA
Duration: 21 Mar 201124 Mar 2011

Publication series

Name
PublisherACM

Conference

ConferenceSAC'11
Period21/03/1124/03/11

Keywords

  • Conf.proc. > 3 pag

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