An experimental analysis of spot defects in SRAMs: realistic fault models and test

S Hamdioui, AJ van de Goor Ph D

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

111 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the ninth Asian test symposium
Editors DC Young
Place of PublicationPiscataway
PublisherIEEE Society
Pages131-138
Number of pages8
ISBN (Print)0-7695-0887-1
Publication statusPublished - 2000
EventAsian test symposium (ATS 2000), Taipei - Piscataway
Duration: 4 Dec 20006 Dec 2000

Publication series

Name
PublisherIEEE

Conference

ConferenceAsian test symposium (ATS 2000), Taipei
Period4/12/006/12/00

Keywords

  • ZX Int.klas.verslagjaar < 2002

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