@inproceedings{a64f951bee864344b887fbda43e3c686,
title = "An experimental analysis of spot defects in SRAMs: realistic fault models and test",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "S Hamdioui and {van de Goor Ph D}, AJ",
year = "2000",
language = "Undefined/Unknown",
isbn = "0-7695-0887-1",
publisher = "IEEE Society",
pages = "131--138",
editor = "{DC Young}",
booktitle = "Proceedings of the ninth Asian test symposium",
note = "Asian test symposium (ATS 2000), Taipei ; Conference date: 04-12-2000 Through 06-12-2000",
}