An expert system for recognition of facial actions and their intensity

M Pantic; LJM Rothkrantz

An expert system for recognition of facial actions and their intensity

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	AAAI-2000 - IAAI-2000: proceedings
Place of Publication	Menlo Park
Publisher	American Association for Artificial Intelligence (AAAI)
Pages	1026-1033
Number of pages	8
ISBN (Print)	0-262-51112-6
Publication status	Published - 2000
Event	17th National Conference on Artificial Intelligence - 12th Conference on Innovative Applications of Artificial Intelligence, Austin - Menlo Park Duration: 30 Jul 2000 → 3 Aug 2000

Publication series

Name
Publisher	AAAI

Conference

Conference	17th National Conference on Artificial Intelligence - 12th Conference on Innovative Applications of Artificial Intelligence, Austin
Period	30/07/00 → 3/08/00

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{f28adb0d855c4d3aacdac852379e9df6,

title = "An expert system for recognition of facial actions and their intensity",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "M Pantic and LJM Rothkrantz",

year = "2000",

language = "Undefined/Unknown",

isbn = "0-262-51112-6",

publisher = "American Association for Artificial Intelligence (AAAI)",

pages = "1026--1033",

booktitle = "AAAI-2000 - IAAI-2000: proceedings",

address = "United States",

note = "17th National Conference on Artificial Intelligence - 12th Conference on Innovative Applications of Artificial Intelligence, Austin ; Conference date: 30-07-2000 Through 03-08-2000",

}

Pantic, M & Rothkrantz, LJM 2000, An expert system for recognition of facial actions and their intensity. in AAAI-2000 - IAAI-2000: proceedings. American Association for Artificial Intelligence (AAAI), Menlo Park, pp. 1026-1033, 17th National Conference on Artificial Intelligence - 12th Conference on Innovative Applications of Artificial Intelligence, Austin, 30/07/00.

TY - GEN

T1 - An expert system for recognition of facial actions and their intensity

AU - Pantic, M

AU - Rothkrantz, LJM

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-262-51112-6

SP - 1026

EP - 1033

BT - AAAI-2000 - IAAI-2000: proceedings

PB - American Association for Artificial Intelligence (AAAI)

CY - Menlo Park

T2 - 17th National Conference on Artificial Intelligence - 12th Conference on Innovative Applications of Artificial Intelligence, Austin

Y2 - 30 July 2000 through 3 August 2000

ER -