An industrial evaluation of DRAM tests

AJ van de Goor

Research output: Contribution to journalArticleScientificpeer-review

7 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)430-440
Number of pages11
JournalIEEE Design & Test of Computers
Volume21
Issue number5
Publication statusPublished - 2004

Keywords

  • academic journal papers
  • ZX CWTS JFIS < 1.00

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