An interferometer to measure the form figure of aspherical mirrors as used in {EUV} lithography.

RG Klaver, H van Brug, JJM Braat

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

Original languageUndefined/Unknown
Title of host publicationLaser Metrology and Inspection.
EditorsHans J Tiziani, Pramod K Rastogi
PublisherSPIE
Pages123-132
Number of pages10
ISBN (Print)0-8194-3309-8
Publication statusPublished - 1999

Publication series

Name
PublisherEuropto/SPIE
Name
Volume3823

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