An Outlook on Power Electronics Reliability and Reliability Monitoring

Henry A. Martin; Edsger C.P. Smits; R. H. Poelma; Willem D. van Driel; G. Q. Zhang

doi:10.1007/978-3-031-59361-1_10

An Outlook on Power Electronics Reliability and Reliability Monitoring

Henry A. Martin^*, Edsger C.P. Smits, R. H. Poelma, Willem D. van Driel, G. Q. Zhang

^*Corresponding author for this work

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific › peer-review

Abstract

The increasing awareness of environmental concerns and sustainability underlines the importance of energy-efficient systems, renewable energy technologies, electric vehicles, and smart grids. Hence, stringent constraints and safety regulations have been prompted to meet reliability standards in power electronics. This chapter provides a comprehensive outlook on the current state of power semiconductor devices, field-critical applications, dominant degradation mechanism (chip-related and package-related), and the emerging measurement techniques for reliability/condition monitoring. This chapter delves into the underlying physics behind each reliability measurement method reviewed. A comparative summary of cost, complexity, online monitoring capability, accuracy, and intrusiveness is provided to enable readers to make informed decisions about the measurement methods. This chapter emphasizes the significance of early fault detection through online monitoring, as it can effectively reduce system downtime for seamless non-interruptive operation.

Original language	English
Title of host publication	Recent Advances in Microelectronics Reliability
Subtitle of host publication	Contributions from the European ECSEL JU Project iRel40
Place of Publication	Cham
Publisher	Springer
Chapter	10
Pages	251-282
Number of pages	32
ISBN (Electronic)	978-3-031-59361-1
ISBN (Print)	978-3-031-59360-4
DOIs	https://doi.org/10.1007/978-3-031-59361-1_10
Publication status	Published - 2024

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1007/978-3-031-59361-1_10

978-3-031-59361-1_10Final published version, 1.47 MB

Cite this

@inbook{44d3ae06d4db44b89117145ddd3759bc,

title = "An Outlook on Power Electronics Reliability and Reliability Monitoring",

abstract = "The increasing awareness of environmental concerns and sustainability underlines the importance of energy-efficient systems, renewable energy technologies, electric vehicles, and smart grids. Hence, stringent constraints and safety regulations have been prompted to meet reliability standards in power electronics. This chapter provides a comprehensive outlook on the current state of power semiconductor devices, field-critical applications, dominant degradation mechanism (chip-related and package-related), and the emerging measurement techniques for reliability/condition monitoring. This chapter delves into the underlying physics behind each reliability measurement method reviewed. A comparative summary of cost, complexity, online monitoring capability, accuracy, and intrusiveness is provided to enable readers to make informed decisions about the measurement methods. This chapter emphasizes the significance of early fault detection through online monitoring, as it can effectively reduce system downtime for seamless non-interruptive operation.",

author = "Martin, {Henry A.} and Smits, {Edsger C.P.} and Poelma, {R. H.} and {van Driel}, {Willem D.} and Zhang, {G. Q.}",

note = "Green Open Access added to TU Delft Institutional Repository {\textquoteleft}You share, we take care!{\textquoteright} – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public. ",

year = "2024",

doi = "10.1007/978-3-031-59361-1_10",

language = "English",

isbn = "978-3-031-59360-4",

pages = "251--282",

booktitle = "Recent Advances in Microelectronics Reliability",

publisher = "Springer",

}

An Outlook on Power Electronics Reliability and Reliability Monitoring. / Martin, Henry A.; Smits, Edsger C.P.; Poelma, R. H. et al.
Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU Project iRel40. Cham: Springer, 2024. p. 251-282.

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific › peer-review

TY - CHAP

T1 - An Outlook on Power Electronics Reliability and Reliability Monitoring

AU - Martin, Henry A.

AU - Smits, Edsger C.P.

AU - Poelma, R. H.

AU - van Driel, Willem D.

AU - Zhang, G. Q.

N1 - Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

PY - 2024

Y1 - 2024

N2 - The increasing awareness of environmental concerns and sustainability underlines the importance of energy-efficient systems, renewable energy technologies, electric vehicles, and smart grids. Hence, stringent constraints and safety regulations have been prompted to meet reliability standards in power electronics. This chapter provides a comprehensive outlook on the current state of power semiconductor devices, field-critical applications, dominant degradation mechanism (chip-related and package-related), and the emerging measurement techniques for reliability/condition monitoring. This chapter delves into the underlying physics behind each reliability measurement method reviewed. A comparative summary of cost, complexity, online monitoring capability, accuracy, and intrusiveness is provided to enable readers to make informed decisions about the measurement methods. This chapter emphasizes the significance of early fault detection through online monitoring, as it can effectively reduce system downtime for seamless non-interruptive operation.

AB - The increasing awareness of environmental concerns and sustainability underlines the importance of energy-efficient systems, renewable energy technologies, electric vehicles, and smart grids. Hence, stringent constraints and safety regulations have been prompted to meet reliability standards in power electronics. This chapter provides a comprehensive outlook on the current state of power semiconductor devices, field-critical applications, dominant degradation mechanism (chip-related and package-related), and the emerging measurement techniques for reliability/condition monitoring. This chapter delves into the underlying physics behind each reliability measurement method reviewed. A comparative summary of cost, complexity, online monitoring capability, accuracy, and intrusiveness is provided to enable readers to make informed decisions about the measurement methods. This chapter emphasizes the significance of early fault detection through online monitoring, as it can effectively reduce system downtime for seamless non-interruptive operation.

UR - http://www.scopus.com/inward/record.url?scp=85210892805&partnerID=8YFLogxK

U2 - 10.1007/978-3-031-59361-1_10

DO - 10.1007/978-3-031-59361-1_10

M3 - Chapter

AN - SCOPUS:85210892805

SN - 978-3-031-59360-4

SP - 251

EP - 282

BT - Recent Advances in Microelectronics Reliability

PB - Springer

CY - Cham

ER -

An Outlook on Power Electronics Reliability and Reliability Monitoring

Abstract

Bibliographical note

UN SDGs

Access to Document

Other files and links

Fingerprint

Prognostics and thermal management of power electronic packages

Cite this