An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components

M. Yazdan Mehr, A. Bahrami, H. Fischer, S. Gielen, R. Corbeij, W. D. Van Driel, G. Q. Zhang

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

9 Citations (Scopus)

Fingerprint Dive into the research topics of 'An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components'. Together they form a unique fingerprint.

Engineering & Materials Science