An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components

M. Yazdan Mehr*, A. Bahrami, H. Fischer, S. Gielen, R. Corbeij, W. D. Van Driel, G. Q. Zhang

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

26 Citations (Scopus)

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