Analysis and calibration of process variations for an array of temperature sensors

S. Xie, A. Abarca, J. Markenhof, Xiaoliang Ge, A. Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)

Abstract

This paper presents an analysis and calibration of process variations for an array of temperature sensors, which are incorporated into a CMOS image sensor chip. Making use of the experimental results of more than 500 temperature sensors implemented on the same chip, the proposed calibration method has removed their process variations from 14.3 % to 2.5 % (3 sigma).
Original languageEnglish
Title of host publicationProceedings of IEEE Sensors Conference 2017
Place of PublicationPiscataway, NJ
PublisherIEEE
Pages1-3
Number of pages3
ISBN (Electronic)978-1-5090-1012-7
ISBN (Print)978-1-5090-1013-4
DOIs
Publication statusPublished - 2017
EventIEEE SENSORS 2017 - Glasgow, United Kingdom
Duration: 29 Oct 20171 Nov 2017
http://ieee-sensors2017.org/

Conference

ConferenceIEEE SENSORS 2017
CountryUnited Kingdom
CityGlasgow
Period29/10/171/11/17
Internet address

Keywords

  • BJT based temperature sensor
  • CMOS image sensor
  • sensor array
  • calibration

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