Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices

IS Irobi

Research output: Thesis › Dissertation (TU Delft)

Original language	English
Qualification	Doctor of Philosophy
Awarding Institution	Delft University of Technology
Supervisors/Advisors	Sips, H.J., Promotor Al-Ars, Z, Copromotor, External person
Award date	15 Sept 2011
Place of Publication	Delft
Publisher	IS Irobi
Print ISBNs	978-90-72298-22-5
Publication status	Published - 2011

Keywords

@phdthesis{b6d508d16c9f404e86165d40039b8ed0,

title = "Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices",

keywords = "Diss. prom. aan TU Delft",

author = "IS Irobi",

year = "2011",

language = "English",

isbn = "978-90-72298-22-5",

publisher = "IS Irobi",

type = "Dissertation (TU Delft)",

school = "Delft University of Technology",

}