Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices

IS Irobi

Research output: ThesisDissertation (TU Delft)

Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Sips, H.J., Supervisor
  • Al-Ars, Z, Advisor, External person
Award date15 Sep 2011
Place of PublicationDelft
Publisher
Print ISBNs978-90-72298-22-5
Publication statusPublished - 2011

Keywords

  • Diss. prom. aan TU Delft

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