Analysis of diagnostic methods to prevent failure of critical GIS components

MAG Al-Suhaily, S Meijer, JJ Smit, P Sibbald, J Kanters

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publication2010 International Conference on High Voltage Engineering of Application
    Editors s.n.
    Place of PublicationNew Orleans
    PublisherIEEE Society
    Pages220-223
    Number of pages4
    ISBN (Print)978-1-4244-8285-6/10
    Publication statusPublished - 2010
    Event2010 International Conference on High Voltage Engineering and Application - New Orleans
    Duration: 11 Oct 201014 Oct 2010

    Publication series

    Name
    PublisherIEEE

    Conference

    Conference2010 International Conference on High Voltage Engineering and Application
    Period11/10/1014/10/10

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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