Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies

L Galatro; M Spirito

doi:10.1109/BCTM.2015.7340569

Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

10 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting
Editors	JB Begueret, D Weiser
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	141-144
Number of pages	4
ISBN (Print)	978-1-4673-8551-0
DOIs	https://doi.org/10.1109/BCTM.2015.7340569
Publication status	Published - 2015
Event	BCTM 2015, Boston, USA - Piscataway Duration: 26 Oct 2015 → 28 Oct 2015

Publication series

Name
Publisher	IEEE

Conference

Conference	BCTM 2015, Boston, USA
Period	26/10/15 → 28/10/15

Bibliographical note

harvest

Access to Document

10.1109/BCTM.2015.7340569

Cite this

@inproceedings{eb03b33d86084d3e82d37aa4762dc923,

title = "Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies",

author = "L Galatro and M Spirito",

note = "harvest; BCTM 2015, Boston, USA ; Conference date: 26-10-2015 Through 28-10-2015",

year = "2015",

doi = "10.1109/BCTM.2015.7340569",

language = "English",

isbn = "978-1-4673-8551-0",

publisher = "IEEE Society",

pages = "141--144",

editor = "JB Begueret and D Weiser",

booktitle = "Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting",

}

Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies. / Galatro, L ; Spirito, M.
Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting. ed. / JB Begueret; D Weiser. Piscataway: IEEE Society, 2015. p. 141-144.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Analysis of residual errors due to calibration transfer in on-wafer measurements at mm-wave frequencies

AU - Galatro, L

AU - Spirito, M

N1 - harvest

PY - 2015

Y1 - 2015

U2 - 10.1109/BCTM.2015.7340569

DO - 10.1109/BCTM.2015.7340569

M3 - Conference contribution

SN - 978-1-4673-8551-0

SP - 141

EP - 144

BT - Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting

A2 - Begueret, JB

A2 - Weiser, D

PB - IEEE Society

CY - Piscataway

T2 - BCTM 2015, Boston, USA

Y2 - 26 October 2015 through 28 October 2015

ER -