Analysis of the local extraction method of base and thermal resistance of bipolar transistors

R Setekera, LF Tiemeijer, W Kloosterman, R van der Toorn

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting
EditorsM Möller, et al
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages215-218
Number of pages4
ISBN (Print)978-1-4799-7230-2
DOIs
Publication statusPublished - 2014
Event2014 IEEE BCTM, Coronado, CA, USA - Piscataway, NJ, USA
Duration: 28 Sep 20141 Oct 2014

Publication series

Name
PublisherIEEE

Conference

Conference2014 IEEE BCTM, Coronado, CA, USA
Period28/09/141/10/14

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