Analysis of the local extraction method of base and thermal resistance of bipolar transistors

R Setekera; LF Tiemeijer; W Kloosterman; R van der Toorn

doi:10.1109/BCTM.2014.6981318

Analysis of the local extraction method of base and thermal resistance of bipolar transistors

R Setekera, LF Tiemeijer, W Kloosterman, R van der Toorn

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting
Editors	M Möller, et al
Place of Publication	Piscataway, NJ, USA
Publisher	IEEE Society
Pages	215-218
Number of pages	4
ISBN (Print)	978-1-4799-7230-2
DOIs	https://doi.org/10.1109/BCTM.2014.6981318
Publication status	Published - 2014
Event	2014 IEEE BCTM, Coronado, CA, USA - Piscataway, NJ, USA Duration: 28 Sep 2014 → 1 Oct 2014

Publication series

Name
Publisher	IEEE

Conference

Conference	2014 IEEE BCTM, Coronado, CA, USA
Period	28/09/14 → 1/10/14

Access to Document

10.1109/BCTM.2014.6981318

Cite this

@inproceedings{8088c21af4d3414aa5b19d158d21cf08,

title = "Analysis of the local extraction method of base and thermal resistance of bipolar transistors",

author = "R Setekera and LF Tiemeijer and W Kloosterman and {van der Toorn}, R",

year = "2014",

doi = "10.1109/BCTM.2014.6981318",

language = "English",

isbn = "978-1-4799-7230-2",

publisher = "IEEE Society",

pages = "215--218",

editor = "M M{\"o}ller and {et al}",

booktitle = "Proceedings 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting",

note = "2014 IEEE BCTM, Coronado, CA, USA ; Conference date: 28-09-2014 Through 01-10-2014",

}

Setekera, R, Tiemeijer, LF, Kloosterman, W & van der Toorn, R 2014, Analysis of the local extraction method of base and thermal resistance of bipolar transistors. in M Möller & et al (eds), Proceedings 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting. IEEE Society, Piscataway, NJ, USA, pp. 215-218, 2014 IEEE BCTM, Coronado, CA, USA, 28/09/14. https://doi.org/10.1109/BCTM.2014.6981318

Analysis of the local extraction method of base and thermal resistance of bipolar transistors. / Setekera, R; Tiemeijer, LF; Kloosterman, W; van der Toorn, R.

Proceedings 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting. ed. / M Möller; et al. Piscataway, NJ, USA : IEEE Society, 2014. p. 215-218.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Analysis of the local extraction method of base and thermal resistance of bipolar transistors

AU - Setekera, R

AU - Tiemeijer, LF

AU - Kloosterman, W

AU - van der Toorn, R

PY - 2014

Y1 - 2014

U2 - 10.1109/BCTM.2014.6981318

DO - 10.1109/BCTM.2014.6981318

M3 - Conference contribution

SN - 978-1-4799-7230-2

SP - 215

EP - 218

BT - Proceedings 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting

A2 - Möller, M

A2 - et al, null

PB - IEEE Society

CY - Piscataway, NJ, USA

T2 - 2014 IEEE BCTM, Coronado, CA, USA

Y2 - 28 September 2014 through 1 October 2014

ER -