Analysis of the sensitivity of the UHF PD measuring technique

S Meijer, A Bovis, E Gulski, JJ Smit, A Girodet

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

9 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Conference record 2000
Editors	GC Stone
Place of Publication	Piscataway
Publisher	IEEE
Pages	395-399
Number of pages	5
ISBN (Print)	0-7803-5931-3
Publication status	Published - 2000
Event	13th IEEE International Symposium on Electrical Insulation, Anaheim - Piscataway Duration: 2 Apr 2000 → 5 Apr 2000

Name
Publisher	IEEE

Conference	13th IEEE International Symposium on Electrical Insulation, Anaheim
Period	2/04/00 → 5/04/00

Keywords

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title = "Analysis of the sensitivity of the UHF PD measuring technique",

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author = "S Meijer and A Bovis and E Gulski and JJ Smit and A Girodet",

year = "2000",

language = "Undefined/Unknown",

isbn = "0-7803-5931-3",

publisher = "IEEE",

pages = "395--399",

editor = "{GC Stone}",

booktitle = "Conference record 2000",

address = "United States",

note = "13th IEEE International Symposium on Electrical Insulation, Anaheim ; Conference date: 02-04-2000 Through 05-04-2000",

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TY - GEN

T1 - Analysis of the sensitivity of the UHF PD measuring technique

AU - Meijer, S

AU - Bovis, A

AU - Gulski, E

AU - Smit, JJ

AU - Girodet, A

PY - 2000

Y1 - 2000

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-5931-3

SP - 395

EP - 399

BT - Conference record 2000

A2 - GC Stone, null

PB - IEEE

CY - Piscataway

T2 - 13th IEEE International Symposium on Electrical Insulation, Anaheim

Y2 - 2 April 2000 through 5 April 2000

ER -