Original language | Undefined/Unknown |
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Title of host publication | Proceedings of the joint BVM/NVVM meeting |
Editors | HK Koerten |
Pages | 148-150 |
Number of pages | 3 |
Publication status | Published - 1996 |
Analytical Electron Microscopy by scanning in Fourier space
BM Mertens, P Kruit
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific