Analytical Electron Microscopy by scanning in Fourier space

BM Mertens, P Kruit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the joint BVM/NVVM meeting
    EditorsHK Koerten
    Pages148-150
    Number of pages3
    Publication statusPublished - 1996

    Cite this

    Mertens, BM., & Kruit, P. (1996). Analytical Electron Microscopy by scanning in Fourier space. In HK. Koerten (Ed.), Proceedings of the joint BVM/NVVM meeting (pp. 148-150)