Analytical Electron Microscopy by scanning in Fourier space

BM Mertens, P Kruit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProceedings of the joint BVM/NVVM meeting
    EditorsHK Koerten
    Pages148-150
    Number of pages3
    Publication statusPublished - 1996

    Bibliographical note

    ISSN 1381-1371

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