Analytical formulation and electrical measurements of self-heating in silicon BJT's

N Nenadovic; V d'Alessandro; LK Nanver; N Rinaldi; H Schellevis; JW Slotboom

Analytical formulation and electrical measurements of self-heating in silicon BJT's

N Nenadovic, V d'Alessandro, LK Nanver, N Rinaldi, H Schellevis, JW Slotboom

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

12 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	IEEE BCTM 2002 IEEE Bipolar Circuits and Technology Meeting
Place of Publication	Piscataway, NJ. USA
Publisher	IEEE Society
Pages	24-27
Number of pages	4
ISBN (Print)	0-7803-7561-0
Publication status	Published - 2002
Event	IEEE BCTM 2002, Monterey, CA, USA - Piscataway, NJ. USA Duration: 29 Sept 2002 → 1 Oct 2002

Publication series

Name
Publisher	IEEE

Conference

Conference	IEEE BCTM 2002, Monterey, CA, USA
Period	29/09/02 → 1/10/02

Keywords

Elektrotechniek
Techniek
Conf.proc. > 3 pag
ZX Int.klas.verslagjaar < 2002

Cite this

@inproceedings{1ff4f05ab666422083a376bbbd63c375,

title = "Analytical formulation and electrical measurements of self-heating in silicon BJT's",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag, ZX Int.klas.verslagjaar < 2002",

author = "N Nenadovic and V d'Alessandro and LK Nanver and N Rinaldi and H Schellevis and JW Slotboom",

year = "2002",

language = "Undefined/Unknown",

isbn = "0-7803-7561-0",

publisher = "IEEE Society",

pages = "24--27",

booktitle = "IEEE BCTM 2002 IEEE Bipolar Circuits and Technology Meeting",

note = "IEEE BCTM 2002, Monterey, CA, USA ; Conference date: 29-09-2002 Through 01-10-2002",

}

Analytical formulation and electrical measurements of self-heating in silicon BJT's. / Nenadovic, N; d'Alessandro, V; Nanver, LK et al.
IEEE BCTM 2002 IEEE Bipolar Circuits and Technology Meeting. Piscataway, NJ. USA: IEEE Society, 2002. p. 24-27.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Analytical formulation and electrical measurements of self-heating in silicon BJT's

AU - Nenadovic, N

AU - d'Alessandro, V

AU - Nanver, LK

AU - Rinaldi, N

AU - Schellevis, H

AU - Slotboom, JW

PY - 2002

Y1 - 2002

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 0-7803-7561-0

SP - 24

EP - 27

BT - IEEE BCTM 2002 IEEE Bipolar Circuits and Technology Meeting

PB - IEEE Society

CY - Piscataway, NJ. USA

T2 - IEEE BCTM 2002, Monterey, CA, USA

Y2 - 29 September 2002 through 1 October 2002

ER -