Analyzing the impact of process variations on DRAM testing using border resistance traces

Z Al-Ars, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	Undefined/Unknown
Title of host publication	ATS 2003; proceedings of the twelfth Asian test symposium
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE Society
Pages	24-27
Number of pages	4
ISBN (Print)	0-7695-1951-2
Publication status	Published - 2003
Event	Twelfth Asian test symposium, Xi'an, China - Piscataway Duration: 16 Nov 2003 → 19 Nov 2003

Name
Publisher	IEEE

Conference	Twelfth Asian test symposium, Xi'an, China
Period	16/11/03 → 19/11/03

Keywords

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title = "Analyzing the impact of process variations on DRAM testing using border resistance traces",

keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",

author = "Z Al-Ars and {van de Goor}, AJ",

year = "2003",

language = "Undefined/Unknown",

isbn = "0-7695-1951-2",

publisher = "IEEE Society",

pages = "24--27",

editor = "s.n.",

booktitle = "ATS 2003; proceedings of the twelfth Asian test symposium",

note = "null ; Conference date: 16-11-2003 Through 19-11-2003",

}

TY - GEN

T1 - Analyzing the impact of process variations on DRAM testing using border resistance traces

AU - Al-Ars, Z

AU - van de Goor, AJ

PY - 2003

Y1 - 2003

KW - Elektrotechniek

KW - Techniek

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-1951-2

SP - 24

EP - 27

BT - ATS 2003; proceedings of the twelfth Asian test symposium

A2 - s.n., null

PB - IEEE Society

CY - Piscataway

Y2 - 16 November 2003 through 19 November 2003

ER -