Analyzing the impact of process variations on DRAM testing using border resistance traces

Z Al-Ars, AJ van de Goor

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageUndefined/Unknown
Title of host publicationATS 2003; proceedings of the twelfth Asian test symposium
Editors s.n.
Place of PublicationPiscataway
PublisherIEEE
Pages24-27
Number of pages4
ISBN (Print)0-7695-1951-2
Publication statusPublished - 2003
EventTwelfth Asian test symposium, Xi'an, China - Piscataway
Duration: 16 Nov 200319 Nov 2003

Publication series

Name
PublisherIEEE

Conference

ConferenceTwelfth Asian test symposium, Xi'an, China
Period16/11/0319/11/03

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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