Analyzing the radiation degradation of 4-transistor deep submicron technology CMOS image sensors

J Tan, B Buttgen, AJP Theuwissen

Research output: Contribution to journal › Article › Scientific › peer-review

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Article number: 6143978

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title = "Analyzing the radiation degradation of 4-transistor deep submicron technology CMOS image sensors",

author = "J Tan and B Buttgen and AJP Theuwissen",

note = "Harvest Article number: 6143978",

year = "2012",

doi = "10.1109/JSEN.2012.2186287",

language = "English",

volume = "12",

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journal = "IEEE Sensors Journal",

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AU - Tan, J

AU - Buttgen, B

AU - Theuwissen, AJP

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PY - 2012

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U2 - 10.1109/JSEN.2012.2186287

DO - 10.1109/JSEN.2012.2186287

M3 - Article

SN - 1530-437X

VL - 12

SP - 2278

EP - 2286

JO - IEEE Sensors Journal

JF - IEEE Sensors Journal

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ER -