Analyzing the radiation degradation of 4-transistor deep submicron technology CMOS image sensors

J Tan, B Buttgen, AJP Theuwissen

Research output: Contribution to journalArticleScientificpeer-review

31 Citations (Scopus)
Original languageEnglish
Pages (from-to)2278-2286
Number of pages9
JournalIEEE Sensors Journal
Volume12
Issue number6
DOIs
Publication statusPublished - 2012

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