Angular resolved scattering by a nano-textured ZnO/silicon interface

M Schulte; K Bittkau; K Jaeger; AM Ermes; M Zeman; BE Pieters

doi:10.1063/1.3640238

Angular resolved scattering by a nano-textured ZnO/silicon interface

M Schulte, K Bittkau, K Jaeger, AM Ermes, M Zeman, BE Pieters

Photovoltaic Materials and Devices

Research output: Contribution to journal › Article › Scientific › peer-review

22 Citations (Scopus)

Abstract

Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell¿s equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell¿s equations.

Original language	English
Pages (from-to)	1-3
Number of pages	3
Journal	Applied Physics Letters
Volume	99
Issue number	11
DOIs	https://doi.org/10.1063/1.3640238
Publication status	Published - 2011

Keywords

journal letters, notes, etc.
CWTS 0.75 <= JFIS < 2.00

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1063/1.3640238

Cite this

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title = "Angular resolved scattering by a nano-textured ZnO/silicon interface",

abstract = "Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell¿s equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell¿s equations.",

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author = "M Schulte and K Bittkau and K Jaeger and AM Ermes and M Zeman and BE Pieters",

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T1 - Angular resolved scattering by a nano-textured ZnO/silicon interface

AU - Schulte, M

AU - Bittkau, K

AU - Jaeger, K

AU - Ermes, AM

AU - Zeman, M

AU - Pieters, BE

PY - 2011

Y1 - 2011

N2 - Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell¿s equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell¿s equations.

AB - Textured interfaces in thin-film silicon solar cells improve the efficiency by light scattering. A technique to get experimental access to the angular intensity distribution (AID) at textured interfaces of the transparent conductive oxide (TCO) and silicon is introduced. Measurements are performed on a sample with polished microcrystalline silicon layer deposited onto a rough TCO layer. The AID determined from the experiment is used to validate the AID obtained by a rigorous solution of Maxwell¿s equations. Furthermore, the applicability of other theoretical approaches based on scalar scattering theory and ray tracing is discussed with respect to the solution of Maxwell¿s equations.

KW - journal letters, notes, etc.

KW - CWTS 0.75 <= JFIS < 2.00

U2 - 10.1063/1.3640238

DO - 10.1063/1.3640238

M3 - Article

SN - 0003-6951

VL - 99

SP - 1

EP - 3

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

ER -

Angular resolved scattering by a nano-textured ZnO/silicon interface

Abstract

Keywords

UN SDGs

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